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Optical Inspection
When precision optical inspection is required to detect and map physical defects, FCI provides state-of-the art Automated Optical Inspection (AOI) capability.
- FCI utilizes the latest technologies from August and Camtek.
- Fully automated optical inspection systems from the August NSX line and the Camtek Falcon PD line are used.
- Detection of defect sizes down to 10 microns.
- Automated Optical Inspection provides the 2nd stage of the Known Good Package (KGP) process. Wafer maps of electrical probe rejects and maps of optically rejected physical defects are merged to provide KGP.
- Up to 12 inch diameter whole wafers, up to 8 inch diameter diced wafers can be inspected.
- Yield Enhancement data are provided for wafer fabrication process improvement.
- Wafer map import and export is accomplished on a variety of wafer map formats.
- Defect site inking is available.
- Commercial and Military level inspection is available.
The types of defects detected are:
- Wafer fabrication defects
- Bump defects
- Scratches
- Cracks and chips
- Mechanical surface damage
- Probe defects and contamination
Manual Optical Inspection
DSD has the industry's finest Mil-Std Inspectors in the industry. When you have Military or specialized Optical Inspection requirements please give us a call.
Camtek and August Automated Optical Inspection
Our Camtek and August inspection tools represent the industry's state-of-the art automated inspection processing equipment. Custom-tailored programming optimizes defect detection and product yields at the proper balance point.
Click on the "How to Get Started" link to complete the necessary information required to start an order.
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